skip to main content
Lingue:
Filtrati per: Titolo della rivista: X-Ray Spectrometry rimuovi
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

X-ray quasi-lamellar etched multilayers: analysis by coupled-mode theory

Andre, Jean-Michel ; Guen, Karine Le ; Jonnard, Philippe

X-Ray Spectrometry, 2014, Vol.43(2), p.122(4) [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
2
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

X‐ray quasi‐lamellar etched multilayers: analysis by coupled‐mode theory

André, Jean‐Michel ; Guen, Karine Le ; Jonnard, Philippe

X‐Ray Spectrometry, March 2014, Vol.43(2), pp.122-125 [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
3
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

An etched multilayer as a dispersive element in a curved-crystal spectrometer: implementation and performance

Jonnard, Philippe ; Le Guen, Karine ; André, Jean-Michel ; Coudevylle, Jean-René ; Isac, Nathalie ; Jonnard, Philippe (Editor)

X-Ray Spectrometry, 03 May 2012, Vol.41, pp.308-312 [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
4
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

X-ray quasi-lamellar etched multilayers: analysis by coupled-mode theory

André, Jean-Michel ; Le Guen, Karine ; Jonnard, Philippe ; Jonnard, Philippe (Editor)

X-Ray Spectrometry, 11 December 2013, Vol.43, p.122 [Rivista Peer Reviewed]

Accesso online

5
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

High-resolution x-ray analysis with multilayer gratings

Jonnard, Philippe ; Le Guen, Karine ; André, Jean-Michel ; Jonnard, Philippe (Editor)

X-Ray Spectrometry, 29 December 2008, Vol.38, pp.117-120 [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
6
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

Wavelength despersive spectroscopy analysis at high spectral resolution: application to the study of Mo/Si multilayers

Jonnard, Philippe ; Maury, Hélène ; André, Jean‐Michel

X‐Ray Spectrometry, March 2007, Vol.36(2), pp.72-75 [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
7
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

La/B4C small period multilayer interferential mirror for the analysis of boron

André, Jean-Michel ; Jonnard, Philippe ; Michaelsen, C ; Wiesmann, J ; Bridou, Françoise ; Ravet-Krill, Marie-Françoise ; Arnaud, Jérôme ; Delmotte, Franck ; Filatova, E. O ; de Rossi, Sébastien (Editor)

X-Ray Spectrometry, 2005, Vol.34(3), pp.203-206 [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
8
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

Soft x‐ray multilayer monochromator with improved resolution and low specular background

André, Jean‐Michel ; Benbalagh, Rabah ; Barchewitz, Robert ; Ravet, Marie‐Françoise ; Raynal, Alain ; Delmotte, Frank ; Bridou, Françoise ; Julie, Gwaénäelle ; Bosseboeuf, Alain ; Laval, René ; Soullié, Gérard ; Rémond, Christian ; Fialin, Michel

X‐Ray Spectrometry, July 2001, Vol.30(4), pp.212-215 [Rivista Peer Reviewed]

Accesso online

Vedi tutte le versioni
9
Soft x-ray multilayer monochromator with improved resolution and low specular background: Soft x-ray multilayer monochromator
Material Type:
Articolo
Aggiungi allo Scaffale Elettronico

Soft x-ray multilayer monochromator with improved resolution and low specular background: Soft x-ray multilayer monochromator

André, Jean-Michel ; Benbalagh, Rabah ; Barchewitz, Robert ; Ravet, Marie-Françoise ; Raynal, Alain ; Delmotte, Frank ; Bridou, Françoise ; Julie, Gwaénäelle ; Bosseboeuf, Alain ; Laval, René ; Soullié, Gérard ; Rémond, Christian ; Fialin, Michel

X-Ray Spectrometry, 07/2001, Vol.30(4), pp.212-215 [Rivista Peer Reviewed]

Accesso online

Ricerca in corso nelle risorse remote ...